Measurement of the 4Pkonfocal point spread function prow& 75 nm axial resolution

نویسندگان

  • S. W. Hell
  • H. K. Stelzer
چکیده

In a 4Pi-confocal microscope the specimen is illuminated and observed coherently from above and below such that the numerical aperture is increased [S. W. Hell, European Patent Application 91121368.4 (filed 1990, published 1992), S. W. Hell and E. H. K. Stelzer, J. Opt. Sot. Am. A9,2159 (.1992)]. The point spread functions of 4Pi-confocal and confocal microscopes were measured. Our measurements prove a threeto seven-fold increase of axial resolution, thus opening the prospect for a powerful three-dimensional imaging technique with an axial resolution down to 75 nm.

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تاریخ انتشار 1999